Seventh IEEE International Workshop on
Testing Three-Dimensional Stacked Integrated Circuits
in conjunction with ITC / Test Week 2016
November 17-18, 2016 - Convention Center Fort Worth, TX, USA
Proceedings of the previous events (incl. 2013) are now available for download
The proceedings of 2010-2013 editions can be downloaded from here.
Website hosted by Tallinn University of Technology