Seventh IEEE International Workshop on
Testing Three-Dimensional Stacked Integrated Circuits
in conjunction with ITC / Test Week 2016
November 17-18, 2016 - Convention Center Fort Worth, TX, USA
3D-TEST 2013 Best Paper Award

The best paper award of the 2013 3D-TEST Workshop in Anaheim, California has been awarded to Makoto Nagata, Satoshi Takaya, and Hiroaki Ikeda for their paper entitled In-Place Signal and Power Noise Waveform Capturing Within 3D Chip Stacking.

The slides of their presentation can be downloaded from here.


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