First IEEE International Workshop on
Testing Three-Dimensional Stacked Integrated Circuits
3D-Test
in conjunction with ITC / Test Week 2010
November 4-5, 2010 - Convention Center - Austin, Texas, USA
Registration

Participation to the 3D-TEST Workshop requires registration and a registration fee. The registration fee includes the opening address, technical sessions, Electronic Workshop Digest, workshop reception, break refreshments, continental breakfast, and lunch. Registration and registration fees are handled by the IEEE International Test Conference.

Online registration is available via ITC registration page at http://www.itctestweek.org/register. Alternatively, register on-site during Test Week at the ITC Registration Counter at the Austin Convention Center; admission for on-site registrants is subject to availability.


ITC registration: http://www.itctestweek.org/register

Registration Fees

Rates  

IEEE/CS Member

$295

Nonmember

$370

IEEE/CS Student Member

$160

Nonmember Student

$200

 

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