First IEEE International Workshop on
Testing Three-Dimensional Stacked Integrated Circuits
in conjunction with ITC / Test Week 2010
November 4-5, 2010 - Convention Center - Austin, Texas, USA

Participation to the 3D-TEST Workshop requires registration and a registration fee. The registration fee includes the opening address, technical sessions, Electronic Workshop Digest, workshop reception, break refreshments, continental breakfast, and lunch. Registration and registration fees are handled by the IEEE International Test Conference.

Online registration is available via ITC registration page at Alternatively, register on-site during Test Week at the ITC Registration Counter at the Austin Convention Center; admission for on-site registrants is subject to availability.

ITC registration:

Registration Fees


IEEE/CS Member




IEEE/CS Student Member


Nonmember Student



Website hosted by Tallinn University of Technology