Past Events
- 2010: First IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits 3D-TEST. November 4-5, 2010 - Convention Center - Austin, Texas, USA
- 2011: Second IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits 3D-TEST. September 22-23, 2011 - Disneyland Hotel - Anaheim, California, USA
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