Sixth IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits 3D-Test 2015

Sixth IEEE International Workshop on
Testing Three-Dimensional Stacked Integrated Circuits

3D-Test

in conjunction with ITC / Test Week 2015
October 8-9, 2015 - Disneyland Hotel � Anaheim, California, USA

Registration

You are invited to participate in the workshop. Participation requires registration and a registration fee. Workshop registration includes access to all technical sessions, Electronic Workshop Digest (containing extended abstracts, papers, slides, posters, as made available by their presenters), workshop reception, continental breakfast, lunch, and break refreshments.

On-line registration for 3D-TEST 2015 registration is handled by ITC, and at the registration page you can register for ITC and/or 3D-TEST. Click on http://itctestweek.org/register to go to the registration page.

Alternatively, register on-site during Test Week at the ITC Registration Counter. Admission for on-site registrants is subject to availability.