------------------------------------------------------------------------------- -- TI SN74BCT8244A -- -- IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device -- -- with Octal Buffers -- ------------------------------------------------------------------------------- -- Created by : Texas Instruments Incorporated -- -- Documentation : SN74BCT8244A Data Sheet (SCBS042) -- -- Product Status: Released to Production (RTP) -- -- BSDL revision : 2.1 -- -- BSDL status : Production -- -- Date created : 05/01/94 -- -- Last modified : 07/26/97 -- -- Modification history - -- -- - misc clean-up, cosmetic only -- ------------------------------------------------------------------------------- -- -- -- IMPORTANT NOTICE -- -- -- -- Texas Instruments (TI) reserves the right to make changes to its -- -- products or to discontinue any semiconductor product or service without -- -- notice, and advises its customers to obtain the latest version of -- -- relevant information to verify, before placing orders, that the -- -- information being relied on is current. -- -- -- -- TI warrants performance of its semiconductor products and related -- -- software to the specifications applicable at the time of sale in -- -- accordance with TI's standard warranty. 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Nor does TI warrant or represent that any license, -- -- either express or implied, is granted under any patent right, copyright, -- -- mask work right, or other intellectual property right of TI covering or -- -- relating to any combination, machine, or process in which such -- -- semiconductor products or services might be or are used. -- -- -- -- Copyright (c) 1997, Texas Instruments Incorporated -- -- -- ------------------------------------------------------------------------------- entity sn74bct8244a is generic (PHYSICAL_PIN_MAP : string := "UNDEFINED"); port (OE_NEG1:in bit; Y1:out bit_vector(1 to 4); Y2:out bit_vector(1 to 4); A1:in bit_vector(1 to 4); A2:in bit_vector(1 to 4); OE_NEG2:in bit; GND, VCC:linkage bit; TDO:out bit; TDI, TMS, TCK:in bit; NC:linkage bit_vector(1 to 4)); use STD_1149_1_1990.all; -- Get standard attributes and definitions attribute PIN_MAP of sn74bct8244a : entity is PHYSICAL_PIN_MAP; constant JT : PIN_MAP_STRING := "OE_NEG1:1, Y1:(2,3,4,5)," & "Y2:(7,8,9,10), A1:(23,22,21,20)," & "A2:(19,17,16,15), OE_NEG2:24, GND:6," & "VCC:18, TDO:11, TDI:14, TMS:12, TCK:13"; constant DW : PIN_MAP_STRING := "OE_NEG1:1, Y1:(2,3,4,5)," & "Y2:(7,8,9,10), A1:(23,22,21,20)," & "A2:(19,17,16,15), OE_NEG2:24, GND:6," & "VCC:18, TDO:11, TDI:14, TMS:12, TCK:13"; constant NT : PIN_MAP_STRING := "OE_NEG1:1, Y1:(2,3,4,5)," & "Y2:(7,8,9,10), A1:(23,22,21,20)," & "A2:(19,17,16,15), OE_NEG2:24, GND:6," & "VCC:18, TDO:11, TDI:14, TMS:12, TCK:13"; constant FK : PIN_MAP_STRING := "OE_NEG1:9, Y1:(10,11,12,13)," & "Y2:(16,17,18,19), A1:(6,5,4,3)," & "A2:(2,27,26,25), OE_NEG2:7, GND:14, VCC:28," & "TDO:20, TDI:24, TMS:21, TCK:23, NC:(1,8,15,22)"; attribute TAP_SCAN_IN of TDI : signal is true; attribute TAP_SCAN_MODE of TMS : signal is true; attribute TAP_SCAN_OUT of TDO : signal is true; attribute TAP_SCAN_CLOCK of TCK : signal is (20.0e6, BOTH); attribute INSTRUCTION_LENGTH of sn74bct8244a : entity is 8; attribute INSTRUCTION_OPCODE of sn74bct8244a : entity is "EXTEST (00000000, 10000000), " & "BYPASS (11111111, 10000100, 00000101, 10001000, 00000001), " & "SAMPLE (00000010, 10000010), " & "INTEST (00000011, 10000011), " & "HIGHZ (00000110, 10000110), " & -- Bypass with outputs high-z "CLAMP (00000111, 10000111), " & -- Bypass with bs value "RUNT (00001001, 10001001), " & -- Boundary run test "READBN (00001010, 10001010), " & -- Boundary read normal mode "READBT (00001011, 10001011), " & -- Boundary read test mode "CELLTST(00001100, 10001100), " & -- Boundary selftest normal mode "TOPHIP (00001101, 10001101), " & -- Boundary toggle out test mode "SCANCN (00001110, 10001110), " & -- BCR scan normal mode "SCANCT (00001111, 10001111) " ; -- BCR scan test mode attribute INSTRUCTION_CAPTURE of sn74bct8244a : entity is "10000001"; attribute INSTRUCTION_DISABLE of sn74bct8244a : entity is "HIGHZ"; attribute INSTRUCTION_GUARD of sn74bct8244a : entity is "CLAMP"; attribute REGISTER_ACCESS of sn74bct8244a : entity is "BOUNDARY (EXTEST, INTEST, SAMPLE, READBN, READBT, CELLTST)," & "BYPASS (BYPASS, HIGHZ, CLAMP, RUNT, TOPHIP)," & "BCR[2] (SCANCN, SCANCT)" ; attribute BOUNDARY_CELLS of sn74bct8244a : entity is "BC_1"; attribute BOUNDARY_LENGTH of sn74bct8244a : entity is 18; attribute BOUNDARY_REGISTER of sn74bct8244a : entity is "0 (BC_1, Y2(4), output3, X, 16, 1, Z)," & -- these outputs controlled "1 (BC_1, Y2(3), output3, X, 16, 1, Z)," & -- by cell 16 "2 (BC_1, Y2(2), output3, X, 16, 1, Z)," & "3 (BC_1, Y2(1), output3, X, 16, 1, Z)," & "4 (BC_1, Y1(4), output3, X, 17, 1, Z)," & -- these outputs controlled "5 (BC_1, Y1(3), output3, X, 17, 1, Z)," & -- by cell 17 "6 (BC_1, Y1(2), output3, X, 17, 1, Z)," & "7 (BC_1, Y1(1), output3, X, 17, 1, Z)," & "8 (BC_1, A2(4), input, X)," & "9 (BC_1, A2(3), input, X)," & "10 (BC_1, A2(2), input, X)," & "11 (BC_1, A2(1), input, X)," & "12 (BC_1, A1(4), input, X)," & "13 (BC_1, A1(3), input, X)," & "14 (BC_1, A1(2), input, X)," & "15 (BC_1, A1(1), input, X)," & "16 (BC_1, OE_NEG2, input, X)," & "16 (BC_1, *, control, 1)," & "17 (BC_1, OE_NEG1, input, X)," & "17 (BC_1, *, control, 1)" ; end sn74bct8244a;