> Generating test patterns to test a certain point of a design

> To generate testpatterns to test certain points of the design, choose Testpattern Generation mode from the menu. In this mode the main work is done on Circuit panel where we can choose signal values by clicking test points.

> The task of a user in this case is to choose a point to be tested and define the signals so that the point is tested and there are no signal conflicts in the design. When creating a test pattern you just have to remember this simple thing – to create test for stuck-at 1 fault the signal at the tested point must be 0 and to create test for stuck-at 0 fault the signal at the tested point must be 1. Next thing is to propagate fault to the output and see that the fault is not masked by another signal.

> Initial input testpattern is the one that was used to test the design last.

> You can choose signals at different testpoints of the design simply by clicking the little box showing the value of signal. You can choose the signal to be 1, 0 or undefined (X). However, if you change the signal you must also correct all the signals influenced by it to avoid conflicts.

> If the chosen testpattern tests stuck-at 1 fault the line turns red. If the chosen testpattern tests stuck-at 0 fault the line turns green. If a signal in a testpoint is undefined but it should have a certain value, the line turns grey. If there appears a conflict of signals somewhere (e.g. gate output signal is not the one defined by gate inputs or input signal is not the same as on Inputs panel) the line turns blue.

> Testpatterns can’t be removed from Testpatterns table one-by-one, clicking the Clear button will remove all inserted patterns from the table.