Testing by CSTP


The following picture shows the model of the device with CSTP that will be used in our laboratory work. Three combinational circuits CC1, CC2, and CC3 are given. The number of inputs of these circuits (a1, a2, a3) may be different and not equal to each other. The same about outputs (b1, b2, b3). The circuits are tested with a single CSTP. It requires only one LFSR for both: test pattern generation and signature analysis. The LFSR has the length C that is greater or equal to the biggest number of inputs or outputs of the circuits. For example, if b2 is greater than a1, a2, a3, b1, and b3, then C>=b2.

See also "Testing by BILBO" section.

 


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Last update: 6 September, 2002 by Artur Jutman