"Digitaalsüsteemide disain ja test"
Õppekirjandus
- Laboratoorsete
tööde ja Cadence kasutamise juhend.
- Lühike
BISTi kasutusjuhend
Olulisem kirjandus:
- S.Mourad, Y.Zorian.
Principles of Testing Electronic Systems. J.Wiley & Sons, Inc. New
York, 2000, 420 p.
- R.Rajsuman. System-on-a-Chip.
Design and Test. Artech House, Boston, London, 2000, 277 p.
- M.L.Bushnell, V.D.Agrawal.
Essentials of Electronic testing. Kluwer Acad. Publishers,
2000, 690 p.
- A.L.Crouch. Design
for Test. Prentice Hall PTR, 1999, 349 p.
- M. Abramovici et. al.
Digital Systems Testing & Testable Designs. Computer Science
Press, 1995, 653 p.
- F. Beenker, R. Bennetts.
Testability Concepts for Digital ICs. Kluwer Academic Publishers,
1995, 212 p.
- H. Bleeker et. al.
Boundary-Scan Test. Practical Approach. Kluwer Academic Publishers,
1993, 225 p.
- E.B. Eichelberger.
Structured Logic Testing. Prentice Hall, 1991, 183 p.
- R. Ubar. Projektirovanije
kontroleprigodnõh diskretnõh sistem. TPI,
1988, 68 p.
Lisakirjandus:
- D. Pradhan. Fault-Tolerant
Computer System Design. Prentice Hall, 1995, 550 p.
- S. Minato. Binary
Decision Diagrams and Applications for VLSI CAD. Kluwer Academic
Publishers, 1996, 141 p.
- A.Ghosh et al. Sequential
Logic Testing and Verification. Kluwer Acad. Publishers,
1992, 214 p.
- A.J. van de Goor.
Testing Semiconductor Memories. Theory and Practice. J. Wiley &
Sons, 1991. 512 p.
- D. Pradhan. Fault-Tolerant
Computing. I, II. Prentice Hall, 1986, 696 p.
- S. Chakradhar, V.D.
Agrawal. Neural Models and Algorithms for Digital Testing. Kluwer
Academic Publishers, 1991. 184 p.
- W. Simpson. System
Test and Diagnosis. Kluwer Academic Publishers,1994. 382
p.
- R. Ubar et. al. Fehler
in Automaten. VEB Verlag Technik Berlin.1989. 216 S.
- R. Ubar et. al. Projektirovanije
avtomatizirovannõh sistem kontrolja. Mashinostrojenije,1983.
224 p.
- R. Ubar. Testovaja
diagnostika tsifrovõh sistem. I, II. TPI,1981.
226 p.
raiub@pld.ttu.ee
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