"Digitaalsüsteemide diagnostika"
Õppekirjandus
Olulisem kirjandus:
- R.Ubar,
J.Raik, H.-T.Vierhaus. Design and Test Technology for Dependable
Systems-on-Chip. IGI Global, 2011, 550 p.
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Ed. Models in Hardware Testing. Springer, 2010, 255 p.
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C.-W.Wu, X.Wen. VLSI Test Principles and Architectures. Design for
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Advances in Electronic Testing. Challenges and Methodologies. Springer,
2006, 412 p.
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E.Gramatova, R.Ubar. Handbook of Testing Electronics Systems. Czech TU
Publishing House, 2005, 400 p.
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A.Paschalis, Y.Zorian. Embedded Processor-Based Self-Test. Kluwer Academic
Publishers, 2004, 216 p.
- A.Miczo.
Digital Logic Testing and Simulation. Wiley-Interscience, New Yersey,
2003, 668 p.
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S.Gupta. Testing of Digital Systems. Cambridge Univ. Press, 2003, 1000 p.
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V.D.Agrawal. Essentials of Electronic testing. Kluwer Acad.
Publishers, 2000, 690 p.
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Minato. Binary Decision Diagrams and Applications for VLSI CAD. Kluwer
Academic Publishers, 1996, 141 p.
Lisakirjandus:
- D.K.
Pradhan, I.G.Harris, Eds. Practical Design Verification. Cambridge Univ.
Press, 2009, 276 p.
- R.Drechsler,
S.Eggersglüss, G.Fey, D.Tille. Test Pattern Generation using Boolean Proof
Engines. Springer, 2009, 192 p.K.Chang, I.L.Markov, V.Bertacco. Functional
Design Errors in Digital Circuits. Springer, 2009, 197 p.
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B.M.Al-Hashimi. Kluwer Academic Publishers, 2003, 178 p.
- S.Mourad,
Y.Zorian. Principles of Testing Electronic Systems. J.Wiley &
Sons, Inc. New York, 2000, 420 p.
- R.Rajsuman.
System-on-a-Chip. Design and Test. Artech House, Boston,
London, 2000, 277 p.
- A.L.Crouch.
Design for Test. Prentice Hall, 1999, 349 p.
- M.
Abramovici et. al. Digital Systems Testing & Testable Designs. Computer
Science Press, 1995, 653 p.
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Pradhan. Fault-Tolerant Computer System Design. Prentice
Hall,1995, 550 p.
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Beenker, R. Bennetts. Testability Concepts for Digital ICs. Kluwer
Academic Publishers, 1995, 212 p.
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Bleeker et. al. Boundary-Scan Test. Practical Approach. Kluwer
Academic Publishers, 1993, 225 p.
- A.J.
van de Goor. Testing Semiconductor Memories. Theory and Practice. J.
Wiley & Sons, 1991. 512 p.
- W.
Simpson. System Test and Diagnosis. Kluwer Academic
Publishers,1994. 382 p.
raiub@pld.ttu.ee
Viimati muudetud: 15.05.2013